EasyScan2 STM

Nanosurf's EasyScan series has gained worldwide popularity through its affordability, portability, and ease of use , with hundreds of sistems currently in use. Now its succesor, the easyScan 2, unites these three unique characteristics with a fully modular system design.

Easy Measuring
The easyScan 2 software is designed to easily obtain quick results. Open the positioning window for the manual coarse approach and automatic fine approach, then open the imaging window to control and display the measurement.



STM Package
The easyScan STM has also established itself as a full-fledged research and development tool. Applications range from routine process control such as spot-checking nanocircuitry to fundamental research such as single electron spin detection. Now, with the easyScan 2 series and its Signal Module, scientists can expand the possibilities of their easyScan STM even further.
Key Features and Benefits

. Portable and compact: Transportable, easy to install with a small footprint
. Quick atomic resolution on a normal table: No need for expensive vibration isolation
. Easy to use: Ideal for nanotechnology education and outreach
. Accessible sample stage and scanning tip: Quick exchange of tip and sample
. Low operating voltage: Safe for all users

EasyScan AFM and Mobile S
The easyScan 2 Basic AFM Package masters topography imaging and force spectroscopy in Static Force mode - the fundamental functions for surface measurement. An ideal package for use in all entry level situations, due to it's easy handling and positioning plus it's flexibility, it can measure almost any samplesizeandgeometry

Smart Technology

Instead of piezoelectric materials that require high voltages and are vulnerable to creep, the easyScan 2 AFM uses a patented open-loop electromagnetic scanner that boasts an XY-Linearity Mean Error of less than 0.6% with low noise and low power consumption. This and similar smart design features allow a reduction in cost without a loss of precision performance. The Basic AFM Package makes professional high resolution surface measurements available to everyone.

Key Features and Benefits

. Portable, compact atomic force microscope: Fits in every lab
. Stand-alone design: Able to measure on small and large samples alike
. Easy to use, dual lens and automatic approach: Ideal for nanotechnology education and outreach
. Cantilever Alignment Chip technology: Easy tip change without adjustment
. World's least expensive commercial AFM
Dynamic AFM Package

More often than not, the sample dictates the measurement mode. Soft, sensitive or sticky samples suffer under static force, even if the forces amount to less than 20 nN.
Dynamic force microscopy eliminates potentially damaging lateral forces, making it the method of choice for many AFM measurements.


Sample: Steel balls Ø 6,0 mm Image size: 50µm x 50µm
Mode: contact mode Sensor: Nanosensors C=1,9N/m Conditions: ambient conditions



Multiple Mode Package
Users who want to measure more than topography will appreciate the Multiple Mode Package, which adds Phase Contrast, Force Modulation, and Scanning Spreading Resistance modes to its standard Static and Dynamic Force capabilities. The easyScan 2 STM, also part of this package, provides the possibility of further analysis of conductive samples.
The Phase Contrast mode images the phase shift of the resonance frequency, which is influenced by changes in the mechanical or chemical properties of the sample surface, allowing simultaneous imaging of material contrast and sample topography. Magnetic Force Microscopy is an extension of the Phase Contrast mode, using a magnetically coated tip to detect local changes in sample magnetisation, and the Scanning Spreading Resistance mode uses an electrically conducting tip to map local resistivity. All these modes allow the detection of features not visible in pure topography measurements: data storage bits, "sticky" areas, and leakage current, to name a few examples.


Advanced Research Package
The Advanced Research Package goes a step further. Not only does it offer all the capabilities of the Multiple Mode Package, it also offers access to and control of all the relevant electronic signals and full COM automation with the Signal Module A and easyScan 2 Scripting Interface, resulting in a full-fledged research microscope with the typical Nanosurf ease of use. The user can modulate driving signals or the scanner position at will, opening up possibilities of lithography and experimental microscopy. All signals are accessed and modulated via standard BNC connections. The results can be analysed in depth and presented in professional standard reports.

While some customers with basic systems may already need a scan head other than the standard mid-range model, owners of the Advanced Research Package will benefit even more from the high resolution Scan Head or the large range Scan Head. The former allows measurements of atomic steps and minuscule features, while the latter allows the metrology of volumes of up to 200'000µm3. Switching between scan heads requires nothing more than loading the calibration file that corresponds to the head plugged into the controller. Nano exploration at its most versatile; the result of successively expanding the easyScan 2 system.

The image shows a 10µm x 10µm image (z-range 38.8nm) Steps on (111) oriented silicon wafer.

Kaynak:http://www.teknotip.com.tr